|
| 摘要: |
| 普遍认为继电保护定检周期越短，保护的可靠性越高。然而，有可能在退出保护定检时，系统发生事故，或者在检验时损坏保护装置，因此，必须权衡利弊，确定合理的定检周期，讨论了一种确定微机保护定检周期的计算方法，该方法在建立电网数学模型的基础上进行计算，具有一定的实用价值。 |
| 关键词: 微机保护 定检周期 可靠性 |
| DOI： |
| 分类号:TM771 |
| 基金项目: |
|
| Define Test Interval for Microprocessor-Based Protection |
|
Feng Weiping
|
| Abstract: |
| A common belief is that a shorter test interval increases overall reliability.It is possible that a system failure occurs while performing routine maintenance or a damage is introduced to a sound relay.It discusses a calculation method which based on a nine state model to define routing test intervals. |
| Key words: microprocessor based protection,routing test interval calculation,reliability, |
