| 引用本文: | 王传坤,何怡刚,王晨苑,李猎,吴晓欣,李济源.计及疲劳损伤的多时间尺度风电变流器IGBT可靠性评估[J].电力自动化设备,2021,41(3): |
| WANG Chuankun,HE Yigang,WANG Chenyuan,LI Lie,WU Xiaoxin,LI Jiyuan.Multi-time scale reliability evaluation of wind power converter IGBT considering fatigue damage[J].Electric Power Automation Equipment,2021,41(3): |
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| 摘要: |
| 现有的风电变流器中绝缘栅双极型晶体管(IGBT)可靠性评估方法在计及疲劳损伤时无法兼顾计算效率与准确度，为此提出了一种多时间尺度可靠性评估算法。首先，基于监测控制和数据采集(SCADA)数据建立风速的威布尔概率分布模型，依据风电变流器拓扑结构推导IGBT模块的电热耦合模型，并引入了常用的寿命预测模型；其次，对风电变流器IGBT进行时间尺度划分，并针对某2 MW风力发电系统，从不同时间尺度开展IGBT可靠性评估；最后，得出了计及疲劳损伤的可靠性评估参量，与现有统计数据对比，从累积损伤度和寿命预测2个方面来验证所提算法的可行性和准确性。结果表明，所提算法相较于现有算法，可以更加准确高效地评估IGBT的健康状况。 |
| 关键词: 疲劳损伤 威布尔分布 IGBT 风电变流器 多时间尺度 可靠性 |
| DOI：10.16081/j.epae.202101007 |
| 分类号:TM46;TM614 |
| 基金项目:国家自然科学基金资助项目(51977153,51977161,51577046)；国家自然科学基金重点资助项目(51637004)；国家重点研发计划项目(2016YFF0102200)；装备预先研究重点项目(41402040301) |
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| Multi-time scale reliability evaluation of wind power converter IGBT considering fatigue damage |
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WANG Chuankun, HE Yigang, WANG Chenyuan, LI Lie, WU Xiaoxin, LI Jiyuan
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School of Electrical Engineering and Automation, Wuhan University, Wuhan 430061, China
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| Abstract: |
| As existing reliability evaluation methods of wind turbine converter IGBT(Insulated Gate Bipolar Transistor) can’t maintain calculation efficiency and accuracy when considering fatigue damage, a multi-time scale reliability evaluation algorithm is proposed. Firstly, the Weibull probability distribution model of wind speed is established based on SCADA(Supervisory Control And Data Acquisition) data, the electrothermal coupling model of IGBT module is derived based on the topology structure of wind power converter, and the commonly used life prediction model is introduced. Secondly, the time scale of wind power converter IGBT is divided, and the reliability evaluation of IGBT is carried out from different time scales for a 2 MW wind power generation system. Finally, the reliability assessment parameters are obtained considering fatigue damage. Compared with the existing statistical data, the feasibility and accuracy of the proposed algorithm are verified from two aspects of cumulative damage degree and life prediction. The results show that the proposed algorithm can evaluate the health status of IGBT more accurately and effectively than the existing algorithms. |
| Key words: fatigue damage Weibull distribution Insulated Gate Bipolar Transistors(IGBT) wind power converter multi-time scale reliability |
